Lab Demonstrations of Analytical Probes of Polymer Adhesion and Interfaces

Free Characterization Facility Workshop

The Institute of Technology Characterization Facility presents:
http://www.charfac.umn.edu/

Laboratory Demo of Analytical Probes of Polymer Adhesion and Interfaces
Thursday, January 15, 2009, 8:00 AM to 4:30 PM

UNIVERSITY OF MINNESOTA
Electrical Engineering and Computer Science (EE/CS) 3-230
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Open to IPrime member companies, invited guests, faculty and students (For those considering IPrime membership, please Bob Lewis, lewis@cems.umn.edu, about attending these workshops free of charge as an IPrime guest.)

The Institute of Technology Characterization Facility will perform free demonstrations on CharFac instruments. Demonstration will include a subset of:

AFM tip-sample adhesion imaging under variable humidity and temperature

Microtomed samples to expose polymer-polymer interfaces

3D chemical imaging with confocal Raman spectroscopy

Surface analytical techniques such as X-ray photoelectron spectroscopy (XPS/ESCA) and time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Full Program Schedule:

8:00 - 8:25 Registration 

8:25 - 8:30 Greg Haugstad, CharFac
Welcome

8:30 - 9:15 Sergei Magonov, Agilent Technologies
AFM: Introduction and local electrical property characterization

9:15 - 9:40 Greg Haugstad, CharFac
Environmental pulsed force mode AFM 

9:40 - 9:55 Break

9:55 - 10:40 Kevin Kjoller, Anasys Instruments
Heated Tip AFM

10:40 - 11:05 Jinping Dong, CharFac
Confocal Raman microscopy

11:05 - 11:30 John Thomas, CharFac
X-ray photoelectron spectroscopy

11:30 - 12:30 Lunch
(box lunch provided for industrial members and guests, speakers and faculty)

12:30 - 4:30 Rotating Demonstrations
Four stations: two AFM, confocal Raman, XPS
45 minute demos per station x 4, freelance during the last hour