Lab Demonstrations of Analytical Probes of Polymer Adhesion and Interfaces

Free Characterization Facility Workshop

The Institute of Technology Characterization Facility presents:

Laboratory Demo of Analytical Probes of Polymer Adhesion and Interfaces
Thursday, January 15, 2009, 8:00 AM to 4:30 PM

Electrical Engineering and Computer Science (EE/CS) 3-230
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Open to IPrime member companies, invited guests, faculty and students (For those considering IPrime membership, please Bob Lewis,, about attending these workshops free of charge as an IPrime guest.)

The Institute of Technology Characterization Facility will perform free demonstrations on CharFac instruments. Demonstration will include a subset of:

AFM tip-sample adhesion imaging under variable humidity and temperature

Microtomed samples to expose polymer-polymer interfaces

3D chemical imaging with confocal Raman spectroscopy

Surface analytical techniques such as X-ray photoelectron spectroscopy (XPS/ESCA) and time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Full Program Schedule:

8:00 - 8:25 Registration 

8:25 - 8:30 Greg Haugstad, CharFac

8:30 - 9:15 Sergei Magonov, Agilent Technologies
AFM: Introduction and local electrical property characterization

9:15 - 9:40 Greg Haugstad, CharFac
Environmental pulsed force mode AFM 

9:40 - 9:55 Break

9:55 - 10:40 Kevin Kjoller, Anasys Instruments
Heated Tip AFM

10:40 - 11:05 Jinping Dong, CharFac
Confocal Raman microscopy

11:05 - 11:30 John Thomas, CharFac
X-ray photoelectron spectroscopy

11:30 - 12:30 Lunch
(box lunch provided for industrial members and guests, speakers and faculty)

12:30 - 4:30 Rotating Demonstrations
Four stations: two AFM, confocal Raman, XPS
45 minute demos per station x 4, freelance during the last hour